Multiport SOLR calibrations: Performance and an analysis of some standards dependencies

62nd ARFTG Microwave Measurements Conference: Differential Measurements, ARFTG 2003

Volumn , Issue , 2003, Pages 205-213

  Martens, J ^a  

^a Anritsu Company USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; MICROWAVE MEASUREMENT; OPTIMIZATION; PROBES; SCATTERING PARAMETERS;

CALIBRATION TECHNIQUES; HEURISTIC ANALYSIS; MULTI-PORT; MULTIPORT CALIBRATION; MULTIPORT S-PARAMETERS; ON-WAFER; OPTIMAL COMBINATION; SIGNAL PROBES;

STANDARDS;

EID: 84946097652     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGF.2003.01459775     Document Type: Conference Paper

References (6)

1. A. Ferrero, "Two-port network analyzer calibration using an unknown thru", IEEE Micr. And Guided Wave Lett., vol. 2, Dec. 1992, pp. 505-507.
2. S. Basu and L. Hayden, "An SOLR calibration for accurate measurement of orthogonal on-wafer DUTs", IEEE Int. Micr. Symp. Dig., June 1997, vol. 3, pp. 1335-1338.
3. st ARFTG Conference Proceedings, Baltimore, June 1998.
4. A. Ferrero, "Multiport calibration theory", presented at the 2003 IEEE Int. Micr. Symp., Workshop WMB, Philadelphia, PA, June 2003.
5. A. Ferrero, U. Pisani, and K. J. Kerwin, "A new implementation of a multiport automatic network analyzer", IEEE Trans. Microwave Theory Tech., vol. 40, Nov. 1992, pp. 2078-2085.
6. W.-K. Deng and T.-H. Chu, "A three-port Vector Network Analyzer-measurement system, calibration and results", IEEE Int. Micr. Symp. Dig., May 2001, vol. 3, pp. 1531-1534.