The potential of pan-sharpened EnMAP data for the assessment of wheat LAI

Remote Sensing

Volumn 7, Issue 10, 2015, Pages 12737-12762

  Siegmann, Bastian ^a   Jarmer, Thomas ^a   Beyer, Florian ^a   Ehlers, Manfred ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

AisaEAGLE; EnMAP; Hyperspectral; Leaf area index; Pan sharpening; Partial least squares regression; Sentinel 2

Indexed keywords

AGRICULTURE; APPLICATION PROGRAMS; IMAGE RESOLUTION; LEAST SQUARES APPROXIMATIONS; PLANTS (BOTANY);

AISAEAGLE; ENMAP; HYPERSPECTRAL; LEAF AREA INDEX; PAN-SHARPENING; PARTIAL LEAST SQUARES REGRESSION; SENTINEL-2;

PHOTOMAPPING;

EID: 84945937636     PISSN: None     EISSN: 20724292     Source Type: Journal    
DOI: 10.3390/rs71012737     Document Type: Article

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