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Volumn 15, Issue 1, 2002, Pages 143-154

Fault isolation for diagnosis: Nuisance rejection and multiple hypotheses testing

Author keywords

Fault isolation and diagnosis; Hypotheses testing; Multiple hypotheses; Nuisance parameters

Indexed keywords

AUTOMATION; ELECTRIC FAULT CURRENTS; PROBLEM SOLVING; STATISTICAL MECHANICS;

EID: 84945565331     PISSN: 14746670     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.3182/20020721-6-es-1901.01646     Document Type: Conference Paper
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.