Characterization of Cu(In,Ga)Se2 (CIGS) films with varying gallium ratios

Journal of Alloys and Compounds

Volumn 657, Issue , 2016, Pages 873-877

  Peace, Bernadette ^a   Claypoole, Jesse ^a   Sun, Neville ^b   Dwyer, Dan ^a   Eisaman, Matthew D ^c,d,e   Haldar, Pradeep ^a   Efstathiadis, Harry ^a  

^a SUNY POLYTECHNIC INSTITUTE   (United States)

^b Angstrom Sun Technologies Inc   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d STONY BROOK UNIVERSITY   (United States)

^e Stony Brook University   (United States)

Author keywords

Atomic force microscopy (AFM); Energy storage materials; Photovoltaics; Scanning electron microscopy (SEM); Semiconductors; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ENERGY GAP; ENERGY STORAGE; FILMS; GRADING; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; SEMICONDUCTING SELENIUM COMPOUNDS; SEMICONDUCTOR MATERIALS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS;

ABSORBER FILMS; ABSORBER LAYERS; CIGS ABSORBER LAYERS; CIGS SOLAR CELLS; CU (IN ,GA)SE; FLORESCENCE SPECTROSCOPY; PHOTOVOLTAICS; SODA LIME GLASS SUBSTRATE;

GALLIUM ALLOYS;

EID: 84945535109     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2015.09.006     Document Type: Article

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