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Volumn 15, Issue 1, 2002, Pages 453-458

Testing embedded control systems using hardware-in-the-loop simulation and temporal logic

Author keywords

Embedded systems; Simulation; Temporal logic

Indexed keywords

AUTOMATION; COMPUTER CIRCUITS; COMPUTER SOFTWARE; CONTROL SYSTEMS; HARDWARE; HARDWARE-IN-THE-LOOP SIMULATION; SYNTHETIC APERTURES; TEMPORAL LOGIC; TRACTION (FRICTION);

EID: 84945534891     PISSN: 14746670     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.3182/20020721-6-es-1901.00981     Document Type: Conference Paper
Times cited : (2)

References (16)
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    • Neglect testing at your peril
    • O'Connor, P.D.T. (2001). Neglect testing at your peril. IEEE Spectrum 38(7), 18.
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    • O'Connor, P.D.T.1
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    • Embedded software market transformation through reusable frameworks
    • (T. Henzinger and C. Kirsch, Eds.)
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  • 12
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    • Design of a framework for hardware-in-the-loop simulation and its application to a model helicopter
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    • Sanvido, M.1    Schaufelberger, W.2
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    • Master thesis. Automatic Control Laboratory, ETH Zurich
    • Schär, C. and R. Samedani (2001). HIL framework for Java. Master thesis. Automatic Control Laboratory, ETH Zurich.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.