Accurate dependability analysis of CAN-based networked systems

Proceedings - 16th Symposium on Integrated Circuits and Systems Design, SBCCI 2003

Volumn , Issue , 2003, Pages 337-342

  Perez J ^a   Sonza Reorda, M ^b   Violante, M ^b  

^a UNIVERSIDAD DE LA REPÚBLICA   (Uruguay)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

Aircraft; Application software; Automotive engineering; Circuit faults; Computer networks; Protocols; Rail transportation; Telecommunication computing; Traffic control; Virtual prototyping

Indexed keywords

AIRCRAFT; APPLICATION PROGRAMS; AUTOMOTIVE ENGINEERING; COMPUTER NETWORKS; INTEGRATED CIRCUITS; INTERNET PROTOCOLS; MICROPROCESSOR CHIPS; NETWORK PROTOCOLS; SYSTEMS ANALYSIS; TRAFFIC CONTROL; VIRTUAL PROTOTYPING;

CIRCUIT FAULTS; COMPUTER-BASED SYSTEM; DEPENDABILITY ANALYSIS; NETWORK INTERCONNECTIONS; NETWORKED SYSTEMS; PROTOCOL CONTROLLER; RAIL TRANSPORTATION; SAFETY CRITICAL APPLICATIONS;

FIGHTER AIRCRAFT;

EID: 84945427787     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SBCCI.2003.1232850     Document Type: Conference Paper

References (18)

1. th VLSI Test Symposium, April 1999, pp. 86-94
2. R. K. Iyer and D. Tang, "Experimental Analysis of Computer System Dependability", Chapter 5 of Fault-Tolerant Computer System Design, D. K. Pradhan (ed.), Prentice Hall, 1996
3. E. Jenn, J. Arlat, M. Rimen, J. Ohlsson, J. Karlsson, "Fault Injection into VHDL Models: the MEFISTO Tool2, Proc. FTCS-24, 1994, pp. 66-75
4. T.A. Delong, B.W. Johnson, J.A. Profeta III, "A Fault Injection Technique for VHDL Behavioral-Level Models", IEEE Design & Test of Computers, Winter 1996, pp. 24-33
5. G.A. Kanawati, N.A. Kanawati, J.A. Abraham, "FERRARI: A Flexible Software-Based Fault and Error Injection System", IEEE Trans. on Computers, Vol 44, N.2, February 1995, pp. 248-260
6. J. Carreira, H. Madeira, J. Silva, "Xception: Software Fault Injection and Monitoring in Processor Functional Units", DCCA-5, Conference on Dependable Computing for Critical Applications, Urbana-Champaign, USA, September 1995, pp. 135-149
7. A. Benso, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, "EXFI: a low cost Fault Injection System for embedded Microprocessor-based Boards", ACM Transactions on Design Automation of Electronic Systems, Vol. 3, Number 4, October 1998, pp. 626-634
8. J. Arlat, M. Aguera, L. Amat, Y. Crouzet, J.C. Fabre, J.-C. Laprie, E. Martins, D. Powell, "Fault Injection for Dependability Validation: A Methodology and some Applications", IEEE Transactions on Software Engineering, Vol. 16, No. 2, February 1990
9. J. Karlsson, P. Liden, P. Dahlgren, R. Johansson, U. Gunneflo, "Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms", IEEE Micro, Vol. 14, No. 1, pp. 8-32, 1994
10. D. Gil, R. Martinez, J. V. Busquets, J. C. Baraza, P. J. Gil, "Fault Injection into VHDL Models: Experimental Validation of a Fault Tolerant Microcomputer System", Dependable Computing EDCC-3, September 1999, pp. 191-208
11. J. Boué, P. Pétillon, Y. Crouzet, "MEFISTO-L: A VHDL-Based Fault Injection Tool for the Experimental Assessment of Fault Tolerance", Proc. FTCS'98, 1998
12. A. Benso, M. Rebaudengo, L. Impagliazzo, P. Marmo, "Fault-List Collapsing for Fault Injection Experiments", RAMS'98: Annual Reliability and Maintainability Symposium, January 1998, pp. 383-388
13. K. H. Huang and J. A. Abraham, "Algorithm-Based Fault Tolerance for Matrix Operations", IEEE Transactions on Computers, vol. 33, June 1984, pp. 518-528
14. Bosch's Controller Area Network Homepage at http://www.can.bosch.com/
15. Can in Automation (CiA) Can Protocol introduction at http://www.can-cia.de/can/protocol/
16. Opencores Can protocol controller project. http://www.opencores.org/projects/can/
17. J. Juárez, P. Bustamante, "Interfase Bus Can", Curso Diseño Lógico 2. Final Project. http://iie.fing.edu.uy/ense/asign/dlp/proyectos/2002/can/
18. P. Civera, L. Macchiarulo, M. Rebaudengo, M. Sonza Reorda, M. Violante, "An FPGA-based approach for speeding-up Fault Injection campaigns on safety-critical circuits", Journal of Electronic Testing:Theory and Applications, Vol. 18, No. 3, June 2002, pp. 261-271