Library characterization and modeling for 130 nm and 90 nm SoC design

Proceedings - IEEE International SOC Conference, SOCC 2003

Volumn , Issue , 2003, Pages 383-386

  Roethig, W ^a  

^a NEC Corporation of America   (United States)

Author keywords

Capacitance; Frequency conversion; Impedance; Integrated circuit interconnections; Integrated circuit modeling; Libraries; Linear circuits; Temperature; Timing; Voltage

Indexed keywords

CAPACITANCE; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; INTEGRATED CIRCUIT INTERCONNECTS; INTEGRATED CIRCUITS; LIBRARIES; OPTICAL FREQUENCY CONVERSION; SYSTEM-ON-CHIP; TEMPERATURE; TIMING CIRCUITS;

INTEGRATED CIRCUIT INTERCONNECTIONS; INTEGRATED CIRCUIT MODELING; LINEAR CIRCUITS; SOC DESIGNS; TIMING; WHITE PAPERS;

INTEGRATED CIRCUIT DESIGN;

EID: 84945395187     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOC.2003.1241548     Document Type: Conference Paper

References (1)

1. IEEE P1603-2003: A standard for an Advanced Library Format describing Integrated Circuit technology, cells and blocks, www.eda.org/alf