A method to recover design patterns using software product metrics

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 1844, Issue , 2000, Pages 318-335

  Kim, Hyoseob ^a   Boldyreff, Cornelia ^b  

^a CITY UNIVERSITY   (United Kingdom)

^b DURHAM UNIVERSITY   (United Kingdom)

Author keywords

Design pattern recovery; Design reuse; Software product metrics

Indexed keywords

COMPUTER SOFTWARE REUSABILITY; LEGACY SYSTEMS; PRODUCT DESIGN; RECOVERY; REUSABILITY; SOFTWARE DESIGN;

DESIGN PATTERN RECOVERY; DESIGN PRACTICE; DESIGN REUSE; OBJECT-ORIENTED SYSTEM; SOFTWARE DESIGN PATTERNS; SOFTWARE MEASUREMENT; SOFTWARE PRODUCT METRICS; SYSTEMATIC METHOD;

OBJECT ORIENTED PROGRAMMING;

EID: 84945304317     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-44995-9_19     Document Type: Conference Paper

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