Capacitively coupled transmission line pulsing CC-TLP-A traceable and reproducible stress method in the CDM-domain

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2003-January, Issue , 2003, Pages

  Wolf, Heinrich ^a   Gieser, Horst ^a   Stadler, Wolfgang ^b   Wilkening, Wolfgang ^c  

^a Fraunhofer Institute Reliability and Microintegration   (Germany)

^b INFINEON TECHNOLOGIES AG   (Germany)

^c ROBERT BOSCH GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

TESTING;

CAPACITIVELY COUPLED; TEST CIRCUIT; TEST METHOD;

TRANSMISSION LINE THEORY;

EID: 84945193266     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. H. Gieser, M. Haunschild, "Very-Fast Transmission Line Pulsing of Integrated Structures and the Charge Device Model", Proc. of the EOS/ESD Symposium 1996, pp. 85-94.
2. H. Gieser, "Verfahren zur Charakterisierung von integrierten Schaltungen mit sehr schnellen Hochstromimpulsen", PhD Thesis, Shaker Verlag Aachen 1999.
3. H. Gieser, personnel communication and presentation to standards committee 5.3 Device Testing CDM. ESDA standard test method for Electrostatic Discharge Sensitivity Testing-Charged Device Model (CDM) ESD STM5.3.1-1999.
4. P. Egger, R. Kropf, H. Gieser, "ESD-Monitor Circuit-A Tool to Investigate the Susceptibility and Failure Mechanisms of the CDM", Proc. of the 6th ESREF, Bordeaux 1995, pp. 223-228.