The FMEDA approach to improve the safety assessment according to the IEC61508

Microelectronics Reliability

Volumn 50, Issue 9-11, 2010, Pages 1230-1235

  Catelani, M ^a   Ciani, L ^a   Luongo, V ^a  

^a UNIVERSITY OF FLORENCE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC MATERIALS; MICROELECTRONICS;

FAILURE MODES , EFFECTS AND DIAGNOSTIC ANALYSIS; IEC 61508; PROBABILITY OF FAILURE ON DEMAND; SAFE FAILURE FRACTION; SAFETY ASSESSMENTS; SAFETY INTEGRITY; SAFETY INTEGRITY LEVELS;

SAFETY ENGINEERING;

EID: 84944652830     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2010.07.121     Document Type: Article

References (10)

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