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Volumn , Issue , 2003, Pages 115-122
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Random vibration response testing of PVDF gages for long-span bridge monitoring
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Author keywords
[No Author keywords available]
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Indexed keywords
AMPLIFIERS (ELECTRONIC);
CIRCUIT SIMULATION;
COST EFFECTIVENESS;
CRYSTALLOGRAPHY;
CUTOFF FREQUENCY;
FREQUENCY RESPONSE;
MONITORING;
SPICE;
STRAIN GAGES;
SYSTEMS ENGINEERING;
CHARGE AMPLIFIERS;
ELECTRICAL POWER;
POLYVINYLIDENE FLUORIDES;
POWER REQUIREMENT;
RANDOM VIBRATION METHODS;
RANDOM VIBRATION RESPONSE;
STRUCTURE MONITORING;
TEMPERATURE COMPENSATION;
STRUCTURAL HEALTH MONITORING;
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EID: 84944448621
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (12)
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