Measurement and Modeling of Self-Heating in SOI NMOSFET’s

IEEE Transactions on Electron Devices

Volumn 41, Issue 1, 1994, Pages 69-75

  Su, Lisa T ^a   Chung, James E ^a   Dimitri, A Antoniadis ^a   Goodson, Kenneth E ^b   Flik, Markus I ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b DAIMLER AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84944378006     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.259622     Document Type: Article

References (15)

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