FPgen - A test generation framework for datapath floating-point verification

Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT

Volumn 2003-January, Issue , 2003, Pages 17-22

  Aharoni, M ^a   Asaf, S ^a   Fournier, L ^a   Koifman, A ^a   Nagel, R ^a  

^a IBM HAIFA RESEARCH LAB   (Israel)

Author keywords

Computer bugs; Debugging; Formal verification; Investments; Manuals; Microprocessors; Power generation; Testing

Indexed keywords

COMPUTER DEBUGGING; DIGITAL ARITHMETIC; INVESTMENTS; MICROPROCESSOR CHIPS; POWER GENERATION; TESTING;

COMPUTER BUGS; CONSTRAINT SOLVING; COVERAGE MODELS; FLOATING-POINT VERIFICATION; ITS EFFICIENCIES; MANUALS; TEST GENERATIONS; VERIFICATION TASK;

FORMAL VERIFICATION;

EID: 84944327460     PISSN: 15526674     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HLDVT.2003.1252469     Document Type: Conference Paper

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