Data-Driven Process Monitoring Based on Modified Orthogonal Projections to Latent Structures

IEEE Transactions on Control Systems Technology

Volumn 24, Issue 4, 2016, Pages 1480-1487

  Yin, Shen ^a   Wang, Guang ^a   Gao, Huijun ^b  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b KING ABDULAZIZ UNIVERSITY   (Saudi Arabia)

Author keywords

Data driven; orthogonal projections to latent structures (O PLS); partial least squares (PLS); process monitoring; Quality related fault detection

Indexed keywords

PROCESS MONITORING;

COMPUTATIONAL LOADS; DATA DRIVEN; LARGE AMOUNTS; LATENT STRUCTURES; LATENT VARIABLE; ORTHOGONAL PROJECTION; POST-PROCESSING SCHEME; TENNESSEE EASTMAN PROCESS;

FAULT DETECTION;

EID: 84944097156     PISSN: 10636536     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCST.2015.2481318     Document Type: Article

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