Development of an advanced HEED (High Efficiency Electro-Emission Device)

Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC

Volumn 2003-January, Issue , 2003, Pages 21-22

  Sakemura, K ^a   Negishi, N ^a   Yamada, T ^a   Satoh, H ^a   Watanabe, A ^a   Yoshikawa, T ^a   Ogasawara, K ^a   Koshida, N ^b  

^a PIONEER CORPORATION   (Japan)

^b TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EFFICIENCY; ELECTRON EMISSION; MICROELECTRONICS; SUBSTRATES; VACUUM TECHNOLOGY;

EMISSION CHARACTERISTICS; EXCITATION SOURCES; GLASS SUBSTRATES; HIGH-EFFICIENCY;

FLAT PANEL DISPLAYS;

EID: 84943536711     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IVMC.2003.1222963     Document Type: Conference Paper

References (3)

1. N.Negishi et al., Jpn. J. Appl. Phys., 36, L939-L941 (1997).
2. T.Yamada et al., Spring JSAP Annual Meeting Abstracts, No.2, p.759 (2000) [in Japanese].
3. T.Yamada et al., IDW'02 Digest, p.1037 (2002).