Defocus noise suppression with combined frame difference and connected component methods in optical scanning holography

Optics Letters

Volumn 40, Issue 17, 2015, Pages 4146-4149

  Ou, Haiyan ^a   Pan, Huiyu ^a   Lam, Edmund Y ^b   Wang, Bing Zhong ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HOLOGRAPHY; HOLOGRAPHY; SPECKLE;

CONNECTED COMPONENT; DEFOCUS; FRAME DIFFERENCES; NOISE SUPPRESSION; RANDOM PHASE MASKS; RANDOM-PHASE; SPECKLE REDUCTION;

SCANNING;

EID: 84943232540     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.40.004146     Document Type: Article

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