An electrical simulation model for the chalcogenide phase-change memory cell

Records of the IEEE International Workshop on Memory Technology, Design and Testing

Volumn 2003-January, Issue , 2003, Pages 86-91

  Salamon, Daniel ^a   Cockburn, Bruce F ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGENIDES; GLASS; HEATING; PHASE TRANSITIONS;

CHALCOGENIDE GLASS; CRYSTALLINE PHASE; ELECTRICAL SIMULATION; HEATING AND COOLING; MULTIPLE ELEMENTS; PHASE CHANGE MEMORY CELLS; PHASE-CHANGE MEMORY TECHNOLOGIES; TRANSITION BEHAVIOR;

PHASE CHANGE MEMORY;

EID: 84942587615     PISSN: 10874852     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.2003.1222366     Document Type: Conference Paper

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