Off-axis digital holographic microscopy: Practical design parameters for operating at diffraction limit

Applied Optics

Volumn , Issue 10, 2014, Pages 2058-2066

  Sánchez Ortiga, Emilio ^a   Doblas, Ana ^a   Saavedra, Genaro ^a   Martínez Corral, Manuel ^a   Garcia Sucerquia, Jorge ^b  

^a UNIVERSITY OF VALENCIA   (Spain)

^b UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

Author keywords

[No Author keywords available]

Indexed keywords

HOLOGRAMS; MICROSCOPIC EXAMINATION; PHASE MEASUREMENT;

DESIGN PARAMETERS; DIFFRACTION LIMITS; DIGITAL HOLOGRAPHIC MICROSCOPY; MICROSCOPE OBJECTIVE; PHASE CURVATURE; PHYSICAL PARAMETERS; QUANTITATIVE PHASE IMAGING; RECORDING PARAMETERS;

DIFFRACTION;

EID: 84942369047     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.53.002058     Document Type: Article

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