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Volumn , Issue , 2003, Pages 339-347
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Future Developments in Surface Metrology
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Author keywords
[No Author keywords available]
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Indexed keywords
CO-ORDINATE SYSTEM;
FUNCTIONAL REQUIREMENT;
GPS SYSTEMS;
NEXT-GENERATION GPS;
SAMPLING PROCEDURES;
SURFACE METROLOGY;
SURFACE TEXTURES;
TOLERANCING;
UNITS OF MEASUREMENT;
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EID: 84942134475
PISSN: None
EISSN: None
Source Type: Book
DOI: 10.1016/B978-190399611-9/50013-X Document Type: Chapter |
Times cited : (4)
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References (14)
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