An EMI-noise analysis on LSI design with impedance estimation

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2002-January, Issue , 2002, Pages 169-174

  Shimazaki, K ^a   Hirano, S ^a   Tsujikawa, H ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

Electromagnetic interference; Electronic countermeasures; Impedance; Large scale integration; Magnetic field measurement; Magnetic noise; Noise measurement; Power supplies; Probes; Semiconductor device measurement

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; ELECTRIC IMPEDANCE; ELECTROMAGNETIC PULSE; FREQUENCY RESPONSE; INTEGRATED CIRCUIT DESIGN; LSI CIRCUITS; MAGNETIC FIELD MEASUREMENT; MAGNETIC FIELDS; MILITARY ELECTRONIC COUNTERMEASURES; PROBES; SEMICONDUCTOR DEVICES; SIGNAL INTERFERENCE;

ELECTRONIC SYSTEMS; ESTIMATION METHODS; IMPEDANCE ESTIMATION; MAGNETIC NOISE; NOISE MEASUREMENTS; POWER SUPPLY; POWER SUPPLY CURRENT; SEMICONDUCTOR DEVICE MEASUREMENTS;

DESIGN;

EID: 84942105097     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2002.996724     Document Type: Conference Paper

References (7)

1. S.Hayashi, and M.Yamada,"EMI-noise analysis under ASIC design environment",ISPD 99, pp.16-21, 1999.
2. Y. Takahata, A. Watanabe, O. Wada, R. Koga, and Y. Fukumoto, "Power current model of IC with internal impedance", Technical report of IEICE. EMCJ99-104, pp. 21-26, December 1999.
3. Y. Fukumoto, T. Matsuishi, Y. Toyota, O. Wada, and R. Koga, "Parameter identification for a power current model of LSI", Technical report of IEICE. EMCJ2000-35, pp. 49-54, July 2000.
4. M. Ogawa, H. Wabuka, and H. Tohya, "A new model of LSI at power supply terminal for EMI Simulation", Technical report of IEICE. EMCJ99-103, pp. 15-20, December 1999.
5. "Verilog hardware description language reference manual (LRM)", IEEE
6. "Electromagnetic procedures for Integrated circuits, magnetic probe method", IEC 47A/525/CDV
7. Hiroyuki Tsujikawa, Seijiro Kojima and Mitsumi Ito, "EMI reduction in LSI", Proc. of The 12th Workshop on Circuits and Systems in Karuizawa, pp.464-474, April 19-20,1999