Exact Moment Matching Model of Transmission Lines and Application to Interconnect Delay Estimation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 3, Issue 2, 1995, Pages 311-322

  Yu, Qingjian ^a   Kuh, Ernest S ^b  

^a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84941867532     PISSN: 10638210     EISSN: 15579999     Source Type: Journal    
DOI: 10.1109/92.386230     Document Type: Article

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