Progress in Resistance Ratio Measurements Using a Cryogenic Current Comparator at LCIE

IEEE Transactions on Instrumentation and Measurement

Volumn 34, Issue 2, 1985, Pages 316-319

  Delahaye, Francois ^a   Reymann, Dominique ^b  

^a Bureau Veritas LCIE   (France)

^b PAVILLON DE BRETEUIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84941455168     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/TIM.1985.4315334     Document Type: Article

References (9)

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2. K. Grohmann, H. D. Hahlbohm, H. Lubbig, and H. Ramin, “Iron-less cryogenic current comparator for AC and DC applications,” IEEE Trans. Instrum. Meas., vol. IM-23, pp. 261-263, 1974.
3. D. B. Sullivan and R. F. Dziuba, “Low temperature direct current comparators,” Rev. Sci. Instrum., vol. 45, pp. 517-519, 1974.
4. S. N. Erne and H. Luther, “High precision dc current source,” IEEE Trans. Instrum. Meas., vol. IM-24, pp. 345-348, 1975.
5. F. Delahaye, “A double constant current source for cryogenic current comparators and its applications,” IEEE Trans. Instrum. Meas., vol. IM-27, pp. 426-429, 1978.
6. H. Seppa, “A self-balancing resistance ratio measurement bridge for standard resistance calibration,” IEEE Cat. 80 CH 1497–7 IM, CPEM Dig., pp. 172,1980.
7. A. Hartland, “Use of a cryogenic current comparator to determine the quantized Hall resistance in a silicon MOSFET,” in Proc. Precision Meas. Fund. Constants II, NBS Spec. Pub. 617, 1982, pp. 543–548.
8. G. W. Small, “Comparison of quantized Hall resistance with a 1 Ω standard,” IEEE Trans. Instrum. Meas., vol. IM-32, pp. 446–447, 1983.
9. K. Von Klitzing, G. Dorda, and M. Pepper, “New method for high accuracy determination of the five structure constant based on quantized Hall resistance,” Phys. Rev. Lett., vol. 45, pp. 494–497, 1980.