Modeling Defect Spatial Distribution

IEEE Transactions on Computers

Volumn 38, Issue 4, 1989, Pages 538-546

  Meyer, Fred J ^a   Pradhan, Dhiraj K ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

Apparent contagion; redundancy; spatial autocorrelation; true contagion; VLSI; yield

Indexed keywords

EID: 84941442325     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.21146     Document Type: Article

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