Ultrasensitive measurement of microcantilever displacement below the shot-noise limit

Optica

Volumn 2, Issue 5, 2015, Pages 393-399

  Pooser, Raphael C ^a   Lawrie, Benjamin ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Quantum optics; Squeezed states

Indexed keywords

DISPLACEMENT MEASUREMENT; INFRARED IMAGING; LIGHT AMPLIFIERS; LIGHT SOURCES; LOCKS (FASTENERS); MEMS; NANOCANTILEVERS; OPTICAL PARAMETRIC AMPLIFIERS; QUANTUM OPTICS; QUANTUM THEORY; SIGNAL TO NOISE RATIO;

BIO-CHEMICAL SENSOR; DIFFERENTIAL MEASUREMENTS; DIRECT MEASUREMENT; MICRO ELECTROMECHANICAL SYSTEM (MEMS); MICRO-CANTILEVERS; QUANTUM CORRELATIONS; SQUEEZED STATE; ULTRASENSITIVE MEASUREMENT;

SHOT NOISE;

EID: 84941096210     PISSN: 23342536     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPTICA.2.000393     Document Type: Article

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