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Volumn 1, Issue , 2012, Pages 547-569

Silicon (Si)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

EID: 84940849063     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-08-054721-3.50029-0     Document Type: Chapter
Times cited : (145)

References (36)
  • 11
    • 84957351126 scopus 로고
    • Optical Coating Laboratory, Inc
    • private communication
    • P. Baumeister, Optical Coating Laboratory, Inc., private communication (1979).
    • (1979)
    • Baumeister, P.1
  • 22
  • 29
    • 85025622499 scopus 로고
    • private communication
    • H. R. Philipp, private communication (1982).
    • (1982)
    • Philipp, H.R.1
  • 32
    • 84940834246 scopus 로고
    • private communication of unpublished data
    • W. R. Hunter, private communication of unpublished data (1982).
    • (1982)
    • Hunter, W.R.1
  • 33
    • 0001392515 scopus 로고
    • Low Energy X-Ray Diagnostics-1981
    • (D. T. Attwood and B. L. Henke, eds.), AIP Conference Proc., No. 75. American Institute of Physics, New York
    • B. L. Henke, P. Lee, T. J. Tanaka, R. L. Shimabukuro, and B. K. Fujikawa, "Low Energy X-Ray Diagnostics-1981" (D. T. Attwood and B. L. Henke, eds.), AIP Conference Proc., No. 75, p. 340. American Institute of Physics, New York, 1981.
    • (1981) , pp. 340
    • Henke, B.L.1    Lee, P.2    Tanaka, T.J.3    Shimabukuro, R.L.4    Fujikawa, B.K.5
  • 34
    • 84918979521 scopus 로고
    • Proc. Int. Conf. Phys. Semicond
    • 10th, Cambridge 1970. U.S. Atomic Energy Commission, Oak Ridge, Tennessee
    • C. Gähwiller and F. C. Brown, Proc. Int. Conf. Phys. Semicond., 10th, Cambridge 1970, p. 213. U.S. Atomic Energy Commission, Oak Ridge, Tennessee, 1970.
    • (1970) , pp. 213
    • Gähwiller, C.1    Brown, F.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.