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Volumn 21, Issue 6, 2014, Pages 1364-1366
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Double-focusing mixing jet for XFEL study of chemical kinetics
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Author keywords
chemical kinetics; mixing jet; sample injection; time resolved diffraction
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Indexed keywords
CHEMICAL ANALYSIS;
ELECTRONS;
FREE ELECTRON LASERS;
KINETICS;
LASER BEAMS;
LIQUIDS;
NANOCRYSTALS;
RADIATION DAMAGE;
REACTION KINETICS;
ADJUSTABLE DELAYS;
CHEMICAL KINETIC MECHANISM;
FAST UNIFORM MIXING;
NANOCRYSTALLOGRAPHY;
SAMPLE INJECTION;
STRUCTURE ANALYSIS;
TIME-RESOLVED DIFFRACTION;
X-RAY FREE ELECTRON LASERS;
MIXING;
CHEMICAL MODEL;
CHEMISTRY;
DEVICES;
HUMAN;
KINETICS;
MICROFLUIDIC ANALYSIS;
PROCEDURES;
X RAY CRYSTALLOGRAPHY;
CHEMISTRY;
CRYSTALLOGRAPHY, X-RAY;
HUMANS;
KINETICS;
MICROFLUIDIC ANALYTICAL TECHNIQUES;
MODELS, CHEMICAL;
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EID: 84939785300
PISSN: 09090495
EISSN: 16005775
Source Type: Journal
DOI: 10.1107/S160057751401858X Document Type: Article |
Times cited : (73)
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References (13)
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