Total ionizing dose effects in 12-bit successive-approximation analog-to-digital converters

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1993, Pages 112-117

  Lee, C I ^a   Rax, B G ^a   Johnston, A H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; IONIZING RADIATION; RADIATION EFFECTS;

COMMERCIAL PROCESS; PROCESSING TECHNOLOGIES; RADIATION PERFORMANCE; SUCCESSIVE APPROXIMATION ANALOG-TO-DIGITAL CONVERTERS; TOTAL IONIZING DOSE; TOTAL IONIZING DOSE EFFECTS;

ANALOG TO DIGITAL CONVERSION;

EID: 84939761467     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1993.700576     Document Type: Conference Paper

References (4)

1. D. H. Sheingold and Analog Devices Inc., "Analog-Digital Conversion Handbook." Prentice-Hall, 1986, pp. 323-326.
2. J. M. McGarrity, "Consideration for Hardening MOS Devices and Circuits for Low Radiation Doses, " IEEE Trans. Nucl. Sci., NS-27. pp. 1739-1744, Dec. 1980.
3. MIL-STD-883D, Method 1019.4 "Total Ionizing Dose Radiation Test Procedure, " (11/1991).
4. T. P. Ma and P. V. Dressendorfer, "Ionizing Radiation Effects in MOS Devices and Circuits." Wiley Inter-Science, 1989, pp. 172-182.