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Volumn 39, Issue 6, 1992, Pages 1982-1989

Space Radiation Effects on Optoelectronic Materials and Components for a 1300 nm Fiber Optic Data Bus

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EID: 84939720264     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211394     Document Type: Article
Times cited : (49)

References (30)
  • 2
    • 84939697060 scopus 로고
    • SEDS Segment Specification for a MIL-STD-1773 Data Bus System for the Small Explorer Data System
    • B.S. Smith, “SEDS Segment Specification for a MIL-STD-1773 Data Bus System for the Small Explorer Data System”, NASA GSFC-730-89-011, 1990.
    • (1990) NASA GSFC-730-89-011
    • Smith, B.S.1
  • 3
    • 0026370759 scopus 로고
    • Transient SEUs in a Fiber Optic System for Space Application
    • K. LaBel, E.G. Stassinopoulos and G.J. Brucker, “Transient SEUs in a Fiber Optic System for Space Application”, IEEE Trans. Nucl. Sci., Vol. 38, No. 6, 1991.
    • (1991) IEEE Trans. Nucl. Sci , vol.38 , Issue.6
    • LaBel, K.1    Stassinopoulos, E.G.2    Brucker, G.J.3
  • 5
    • 0005174739 scopus 로고
    • Radiation Hardened Optoelectronic Components: Sources
    • C.E. Barnes, “Radiation Hardened Optoelectronic Components: Sources”, Proc. SPIE, Vol. 616, pp. 248–52, 1986.
    • (1986) Proc. SPIE , vol.616 , pp. 248-252
    • Barnes, C.E.1
  • 6
    • 0006537695 scopus 로고
    • Radiation Hardened Optoelectronic Components: Detectors
    • J.J. Wiczer, “Radiation Hardened Optoelectronic Components: Detectors”, Proc. SPIE, Vol. 616, pp. 254–66, 1986.
    • (1986) Proc. SPIE , vol.616 , pp. 254-266
    • Wiczer, J.J.1
  • 7
    • 0020267840 scopus 로고
    • Neutron Damage Effects in Laser Diodes
    • C.E. Barnes, “Neutron Damage Effects in Laser Diodes”, Proc. SPIE, Vol. 328, pp. 88–94, 1982.
    • (1982) Proc. SPIE , vol.328 , pp. 88-94
    • Barnes, C.E.1
  • 9
    • 0020102290 scopus 로고
    • Proton Damage Effects on Light Emitting Diodes
    • B.H. Rose and C.E. Barnes, “Proton Damage Effects on Light Emitting Diodes”, J. Appl. Phys., Vol. 53, No. 3, pp. 1772–80, 1982.
    • (1982) J. Appl Phys , vol.53 , Issue.3 , pp. 1772-1780
    • Rose, B.H.1    Barnes, C.E.2
  • 10
    • 0026880125 scopus 로고
    • Radiation Sensitivity of Light Emitting Diodes, Laser Diodes and Photodiodes
    • H. Lischka, H. Henschel, W. Lennartz and H.U. Schmidt, “Radiation Sensitivity of Light Emitting Diodes, Laser Diodes and Photodiodes”, IEEE. Trans. Nucl. Sci., Vol. NS-39, No. 3, pp. 423–27, 1992.
    • (1992) IEEE. Trans. Nucl. Sci , vol.NS-39 , Issue.3 , pp. 423-427
    • Lischka, H.1    Henschel, H.2    Lennartz, W.3    Schmidt, H.U.4
  • 12
  • 15
    • 0001045449 scopus 로고
    • Displacement damage equivalent to dose in silicon devices
    • C.J. Dale, P.W. Marshall, G.P. Summers, and E.A. Wolicki, “Displacement damage equivalent to dose in silicon devices”, Appl. Phys. Lett., Vol. 54, No. 5, pp. 451–3, 1989.
    • (1989) Appl. Phys Lett , vol.54 , Issue.5 , pp. 451-453
    • Dale, C.J.1    Marshall, P.W.2    Summers, G.P.3    Wolicki, E.A.4
  • 16
    • 0025796121 scopus 로고
    • Displacement Damage in Si Imagers for Space Applications
    • C.J. Dale and P.W. Marshall, “Displacement Damage in Si Imagers for Space Applications,” Proc. SPIE, Vol. 1447, pp. 70–86, 1991.
    • (1991) Proc. SPIE , vol.1447 , pp. 70-86
    • Dale, C.J.1    Marshall, P.W.2
  • 19
    • 33144469628 scopus 로고
    • Calibrated Charged Particle Radiation System with Precision Dosimetric Measurement and Control
    • K.M. Murray, W.J. Stapor and C. Castenada, “Calibrated Charged Particle Radiation System with Precision Dosimetric Measurement and Control”, Nucl. Inst. Meth., Vol. 856/57, pp. 1256–9, 1991.
    • (1991) Nucl. Inst Meth , vol.856-857 , pp. 1256-1259
    • Murray, K.M.1    Stapor, W.J.2    Castenada, C.3
  • 20
    • 0025464172 scopus 로고
    • The Radiation Response of a Selfoc Microlens
    • J. D. Weiss, “The Radiation Response of a Selfoc Microlens”, J. Lightwave Tech, Vol. 8, No. 7, pp. 1107–09, 1990.
    • (1990) J. Lightwave Tech , vol.8 , Issue.7 , pp. 1107-1109
    • Weiss, J.D.1
  • 22
    • 0016081559 scopus 로고
    • Deep Level Transient Spectroscopy: a New Method to Characterize Traps in Semiconductors
    • D.V. Lang, “Deep Level Transient Spectroscopy: a New Method to Characterize Traps in Semiconductors”, J. Appl. Phys., Vol. 45, pp. 3023–32, 1974.
    • (1974) J. Appl Phys , vol.45 , pp. 3023-3032
    • Lang, D.V.1
  • 23
    • 0019528281 scopus 로고
    • LPE and VPEIn1-xGaxAsyP 1-y/InP: Transport Properties, Defects, and Device Considerations
    • P.R. Bhattacharya, J.W. Ku, S.J.T. Owen, G.H. Olsen and S. Chiao, “LPE and VPEIn1-xGaxAsyP1-y/InP: Transport Properties, Defects, and Device Considerations”, IEEE J. Quant. Elect., Vol. QE-17, No. 2, pp. 150–60, 1981.
    • (1981) IEEE J. Quant Elect , vol.QE-17 , Issue.2 , pp. 150-160
    • Bhattacharya, P.R.1    Ku, J.W.2    Owen, S.J.T.3    Olsen, G.H.4    Chiao, S.5
  • 24
    • 0042387256 scopus 로고
    • Study of the Main Electron Trap in Ga1-xInxAs Alloys
    • A. Mircea, A. Mitonneau, J. Hallais and M. Jaros, “Study of the Main Electron Trap in Ga1-xInxAs Alloys”, Phys. Rev. B, Vol. 16, No. 8, pp. 3665–75, 1977.
    • (1977) Phys. Rev. B , vol.16 , Issue.8 , pp. 3665-3675
    • Mircea, A.1    Mitonneau, A.2    Hallais, J.3    Jaros, M.4
  • 26
    • 0022890049 scopus 로고
    • Energy Dependence of Proton-Induced Displacement Damage in Silicon
    • E.A. Burke, “Energy Dependence of Proton-Induced Displacement Damage in Silicon,” IEEE Trans. on Nucl. Sci., Vol. NS-33, No. 6, pp. 1276–81, 1986.
    • (1986) IEEE Trans. on Nucl. Sci , vol.NS-33 , Issue.6 , pp. 1276-1281
    • Burke, E.A.1
  • 29
    • 0019533790 scopus 로고
    • Performance of In1-xGaxAsyP 1-y Photodiodes with Dark Current Limited by Diffusion, Generation-Recombination, and Tunneling
    • S.R. Forrest, “Performance of In1-xGaxAsyP1-y Photodiodes with Dark Current Limited by Diffusion, Generation-Recombination, and Tunneling”, IEEE J. Quant. El., Vol. QE-17, No. 2, pp. 217–26, 1981.
    • (1981) IEEE J. Quant. El , vol.QE-17 , Issue.2 , pp. 217-226
    • Forrest, S.R.1
  • 30
    • 84939739619 scopus 로고
    • Small Explorer Data System MIL-STD-1773 Fiber Optic Bus
    • M. Flannagan and K. LaBel, “Small Explorer Data System MIL-STD-1773 Fiber Optic Bus”, NASA Technical Paper 3227, 1992.
    • (1992) NASA Technical Paper 3227
    • Flannagan, M.1    LaBel, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.