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Volumn 1803, Issue , 1993, Pages 235-247

Introduction of a new High Density Plasma reactor concept for high aspect ratio oxide etching

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ELECTROMAGNETIC INDUCTION; ETCHING; PLASMA APPLICATIONS; STICTION; SUPPORTS;

EID: 84939719458     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.142920     Document Type: Conference Paper
Times cited : (7)

References (8)
  • 3
    • 85075794820 scopus 로고
    • Quantification of plasma-surface interactions in fluorocarbon plasma etching of silicon and silicon dioxide
    • David C. Gray and Herbert H. Sawin, "Quantification of Plasma-Surface Interactions in Fluorocarbon Plasma Etching of Silicon and Silicon Dioxide", 1991 Dry Process Symposium, I-1, pp. 1-7, 1991
    • (1991) 1991 Dry Process Symposium , vol.1 , Issue.1 , pp. 1-7
    • Gray, D.C.1    Sawin, H.H.2
  • 4
    • 85075794524 scopus 로고
    • Molecular beam studies of the reaction of fluorine and oxygen with silicon surfaces
    • J. R. Engstrom, M. M. Nelson, D. J. Bonser and T. Engel, "Molecular Beam Studies of the Reaction of Fluorine and Oxygen with Silicon Surfaces", 1991 Dry Process Symposium, I-2, pp. 9-16, 1991
    • (1991) 1991 Dry Process Symposium , vol.1-2 , pp. 9-16
    • Engstrom, J.R.1    Nelson, M.M.2    Bonser, D.J.3    Engel, T.4
  • 5
    • 85075801215 scopus 로고
    • Pulsed laser radiated RIE-control of CFx polymer film
    • M. Kobayashi and M. Nakamura, "Pulsed Laser Radiated RIE-Control of CFx Polymer Film-", 1991 Dry Process Symposium, III-4, pp. 87-91, 1991
    • (1991) 1991 Dry Process Symposium , vol.3-4 , pp. 87-91
    • Kobayashi, M.1    Nakamura, M.2
  • 8
    • 84915447630 scopus 로고
    • Etching silicon dioxide with high selectivity and low polymer formation
    • September, 11/88
    • Gerald Z. Yin, Monique Ben-Dor, Mark S. Chang, D. Rafinejad, "Etching Silicon Dioxide with High Selectivity and Low Polymer Formation", Semiconductor International. September 1988, 11/88
    • (1988) Semiconductor International
    • Yin, G.Z.1    Ben-Dor, M.2    Chang, M.S.3    Rafinejad, D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.