Observations of single-event upset and multiple-bit upset in non-hardened high-density srams in the TOPEX/Poseidon orbit

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1993, Pages 85-92

  Underwood, C I ^a   Ecoffet, R ^b   Duzellier, S ^c   Faguere, D ^c  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b CNES   (France)

^c ONERA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DNA SEQUENCES; GEODETIC SATELLITES; HEAVY IONS; ION BOMBARDMENT; MICRO SATELLITES; RADIATION EFFECTS; RADIATION HARDENING; STATIC RANDOM ACCESS STORAGE; TRANSIENTS;

DATA RECORDERS; ELECTRICAL STATE; HIGHER ORBITS; MULTIPLE BIT UPSET; SINGLE EVENT UPSETS; STANDARD MODEL; SUN SYNCHRONOUS ORBITS; TOPEX/POSEIDON;

ORBITS;

EID: 84939707512     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1993.700572     Document Type: Conference Paper

References (2)

1. C. I Underwood, J. W. Ward, C. S. Dyer and A. J. Sims, "Observations of Single-Event Upsets in Non-Hardened High-Density SRAMs in Sun-Synchronous Orbit", IEEE Trans. Nucl. Sci., NS-39, 1817-1827, 1992.
2. "SPACE RADIATION" software, 1990, Severn Communications Corporation 1023 Benfield Blvd., Millersville, MD 21108 (includes AP8, AE8 and CREME Models).