Localized multispectral crop imaging sensors: Engineering & validation of a cost effective plant stress and disease sensor

SAS 2015 - 2015 IEEE Sensors Applications Symposium, Proceedings

Volumn , Issue , 2015, Pages

  Grieve, Bruce ^a   Hammersley, Simon ^a   Mahlein, Anne Katrin ^b   Oerke, Erich Christian ^b   Goldbach, Heiner ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF BONN   (Germany)

Author keywords

Agriculture; Barley; Crop; Disease; Fungal pathgen; Hyperspectral; Instrument; Sensor; Stress; Sugar beet

Indexed keywords

AGRICULTURE; BUDGET CONTROL; COST EFFECTIVENESS; COST ENGINEERING; CROPS; DIAGNOSIS; DISEASES; IMAGE RESOLUTION; INSTRUMENTS; LIGHT EMITTING DIODES; MACHINERY; SEED; SENSORS; SILICON DETECTORS; SOILS; SPECTROSCOPY; STRESSES; SUGAR BEETS; VIRUSES;

BARLEY; COMMERCIAL PRODUCTS; EQUIPMENT RELIABILITY; FUNGAL PATHGEN; HIGH THROUGHPUT SCREENING; HYPERSPECTRAL; MULTISPECTRAL IMAGING; MULTISPECTRAL SENSORS;

HYPERSPECTRAL IMAGING;

EID: 84939459911     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SAS.2015.7133588     Document Type: Conference Paper

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