Performance Limits of CMOS ULSI

IEEE Transactions on Electron Devices

Volumn 32, Issue 2, 1985, Pages 333-343

  Pfiester, James R ^a   Shott, John D ^b   Meindl, James D ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939365158     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1985.21947     Document Type: Article

References (35)

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