A new criterion for linear 2-port stability using a single geometrically derived parameter

IEEE Transactions on Microwave Theory and Techniques

Volumn 40, Issue 12, 1992, Pages 2303-2311

  Edwards, Marion Lee ^a   Sinsky, Jeffrey H ^a  

^a JOHNS HOPKINS UNIVERSITY APPLIED PHYSICS LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939356269     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.179894     Document Type: Article

References (13)

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