Generation of interface states by ionizing radiation at 80k measured by charge pumping and subthreshold slope techniques

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1347-1354

  Saks, N S ^a   Ancona, M G ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939068374     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337478     Document Type: Article

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