Processing enhanced seu tolerance in high density srams

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1322-1325

  Fu, J S ^a   Weaver, H T ^a   Browning, J S ^a   Lee, K H ^b   Koga, R ^c   Kolanski, W A ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939065085     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337473     Document Type: Article

References (9)

1. J. C. Pickel, “Effects of CMOS Miniaturization on Cosmic-Ray Induced Error Rate,” IEEE Trans. Nucl. Sci., NS-29, 2049 (1982)
2. G. J. Brucker, R. Smeltzer, W. A. Kolasinski and R. Koga, “Soft Error Dependence on Feature Size,” IEEE Trans. Nucl. Sci., NS-31, 1562 (1984).
3. N. Shiono, Y. Sakagawa, M. Sekiguchi, K. Sato, I Sugai, T. Hattori and Y. Hirao, “Single Event Effects in High Density CMOS SRAMs,” IEEE Trans. Nucl. Sci., NS-33, 1632 (1986).
4. E. Takeda, K. Takeuchi, E. Yamasaki, T. Toyabe and K. Itoh, “The Scaling Law of Alpha-Particle-Induced Soft Errors for VLSIs,” Tech. Digest, International Electron Device Meeting, 542 (1986).
5. K. H. Lee, J. C. Desko, R. A. Kohler, C. W. Lawrence, W. J. Nagy, J. A. Shimer, S. Steenwyk, R. E. Anderson and J. S. Fu, “Radiation Hard 1.0µ CMOS Technology,” 1987 this issue.
6. J. H. Adams, “The Natural Radiation Environment Inside Spacecraft,” IEEE Trans. Nucl. Sci., NS-29, 2095 (1982)
7. J. S. Fu, H. T. Weaver, R. Koga and W. A. Kolasinski, “Comparison of 2D Memory SEU Transport Simulation with Experiments,” IEEE Trans. Nucl. Sci., NS-32, 4145 (1985).
8. H. T. Weaver, C. L. Axness, J. S. Fu, J. S. Binkeley, J. Mansfield, “RAM Cell Recovery Mechanisms Following High Energy Ion Strikes,” IEEE Electron Dev. Lett., EDL-8, 7 (1987); C. L. Axness, et al., IEEE Trans. Nucl. Sci., NS-33, 1577 (1986).
9. J. Dziewior and W. Schmid, “Auger Coefficients for Highly Doped and Highly Excited Silicon,” Appl. Phys. Lett., vol. 31, 346 (1977).