Radiation-Induced response of operational amplifiers in low-level transient radiation environments

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1442-1447

  Paulos, John J ^a   Bishop, Richard J ^a   Turflinger, Thomas L ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939014839     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337495     Document Type: Article

References (6)

1. N.W. van Vonno, Y.D. Kim, and D.R. Alexander, “A mixed analog/digital cell family for hardened applications,” Digest of Papers, Government Microelectronics Applications Conf., pp. 477–480, 1986.
2. L.W. Massengill, “The implementation of a general time and voltage dependent current source in the circuit simulation program SPICE.” M.S. Thesis, North Carolina State University, 1984.
3. J.L. Wirth and S.C. Rogers, “The transient response of transistors and diodes to ionizing radiation,” IEEE Trans. on Nuclear Science, Vol. NS-11, Nov. 1964.
4. J S. Nichols, D.R. Alexander, and G.N. Hittinger, “Characterization and modeling of the 709 integrated circuit operational amplifier in an ionizing radiation environment,” IEEE Trans. on Nuclear Science, Vol. NS-16, pp. 172–176, Dec. 1969.
5. D.N. Pocock and J.P. Raymond, ‘Simplified terminal models of complex linear microcircuits for use in computer aided systems analysis,” IEEE Trans. on Nuclear Science, Vol. NS-18, pp. 212–219, Dec. 1971
6. D.N. Pocock and M.G. Krebs, “Terminal modeling and photocurrent compensation of complex microcircuits,” IEEE Trans. on Nuclear Science, Vol. NS-19, pp. 86–93, Dec. 1972.