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IEEE Transactions on Nuclear Science
Volumn 34, Issue 6, 1987, Pages 1792-1795
Seu sensitivity of power converters with mosfets in space
Author keywords

[No Author keywords available]
Indexed keywords

EID: 84939010383     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337556     Document Type: Article
Times cited : (5)
References (4)
  • 1
    • 84939007617 scopus 로고
    • Burnout of Power MOS Transistors with Californium-252 and Cyclotron-88 Heavy Ions
    • presented at Radiation Hardened Electronics Technology Meeting Melbourne, Fla., Oct.
    • A.E. Waskiewicz, “Burnout of Power MOS Transistors with Californium-252 and Cyclotron-88 Heavy Ions,” presented at Radiation Hardened Electronics Technology Meeting Melbourne, Fla., Oct. 1986.
    • (1986)
    • Waskiewicz, A.E.1
  • 2
    • 84939043238 scopus 로고    scopus 로고
    • Measurement of Heavy Ion Induced Burnout Thresholds and Burnout Cross Sections of Power Mos Transistors
    • this conference
    • A.E. Waskiewicz, J.W. Groninger, W.A. Kolasinski, J.W. Adolphson and J.L. Titus, “Measurement of Heavy Ion Induced Burnout Thresholds and Burnout Cross Sections of Power Mos Transistors,” this conference.
    • Waskiewicz, A.E.1    Groninger, J.W.2    Kolasinski, W.A.3    Adolphson, J.W.4    Titus, J.L.5
  • 3
    • 84939037810 scopus 로고
    • Lawrence Berkeley Laboratory Report, LBL-11220, Nov.
    • M.C. Pirrucello and C.A. Tobias, Lawrence Berkeley Laboratory Report, LBL-11220, Nov. 1980.
    • (1980)
    • Pirrucello, M.C.1    Tobias, C.A.2
  • 4
    • 84939012878 scopus 로고    scopus 로고
    • First Nondestructive Measurements of Power FET Burnout Cross Sections
    • this conference.
    • D.L. Oberg and J.L. Wert, “First Nondestructive Measurements of Power FET Burnout Cross Sections,” this conference.
    • Oberg, D.L.1    Wert, J.L.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.