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Volumn 35, Issue 1, 1988, Pages 372-376
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First tests with fully depleted pn-CCD‘s
a a a b b b b c |
Author keywords
[No Author keywords available]
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Indexed keywords
RADIATION DETECTORS;
RADIOGRAPHY - X-RAY;
SEMICONDUCTOR DEVICES, CHARGE TRANSFER;
ENERGY-/POSITION-SENSITIVE RADIATION DETECTORS;
FULLY DEPLETED PN-CCD'S;
IONIZING PARTICLES;
SEMICONDUCTOR DRIFT-CHAMBER PRINCIPLE;
SEMICONDUCTOR DEVICES, CHARGE COUPLED;
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EID: 84939006046
PISSN: 00189499
EISSN: 15581578
Source Type: Journal
DOI: 10.1109/23.12746 Document Type: Article |
Times cited : (14)
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References (4)
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