Nanometre-scale faulting in quartz under an atomic force microscope

Journal of Structural Geology

Volumn 79, Issue , 2015, Pages 75-79

  Omori, Yasutomo ^a   Ikei, Hideaki ^a   Kugimiya, Yasuo ^a   Masuda, Toshiaki ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

Atomic force microscope; Indentation; Linear displacement length scaling relationship; Nanometre scale faulting; Quartz

Indexed keywords

FAULTING; INDENTATION; MAPPING; MICROSCOPES; NANOSTRUCTURED MATERIALS; QUARTZ;

AMBIENT PRESSURES; FAULT PLANES; LINEAR DISPLACEMENTS; MAXIMUM DISPLACEMENT; NANOINDENTATION TESTS; NANOMETRES; ROOM TEMPERATURE; TOPOGRAPHIC MAPPING;

ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY; DISPLACEMENT; FAULTING; INDENTATION; QUARTZ; TOPOGRAPHIC MAPPING; TOPOGRAPHY;

EID: 84938349819     PISSN: 01918141     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jsg.2015.07.008     Document Type: Article

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