A vector corrected high power on-wafer measurement system with a frequency range for the higher harmonics up to 40 GHz

1994 24th European Microwave Conference, EUMA 1994

Volumn 2, Issue , 1994, Pages 1367-1372

  Demmler, M ^a   Tasker, P J ^a   Schlechtweg, M ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY; HARMONIC ANALYSIS; VECTORS;

DEVICE UNDER TEST; FUNCTION OF FREQUENCY; LARGE SIGNAL BEHAVIOR; MEASUREMENT SYSTEM; MICROWAVE TRANSITION ANALYZERS; ON-WAFER MEASUREMENTS; TRANSMISSION COEFFICIENTS; VECTOR MEASUREMENTS;

ELECTRIC POWER SYSTEM MEASUREMENT;

EID: 84937653776     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1994.337406     Document Type: Conference Paper

References (6)

1. J.-E. Müller, M. Laudien, H. Müller: "On-Wafer Load Pull Characterization of Self-Aligned GaAs Power MESFETs", 1991, European Microwave Conference, pp. 1379-1384.
2. F. Van Ray, G. Kompa: "A New On-Wafer Large-Signal Waveform Measurement System with 40 GHz Harmonic Bandwidth", 1992, IEEE MTT-S Digest, pp. 1435-1438.
3. HP product note 70820-1: "The Microwave Transition Analyzer: A Versatile Measurement Set for Bench and Test", 1991
4. J. Fitzpatrick: "Error Models for Systems Measurement", May 1978, Microwave Joumal, pp. 63-66.
5. "An Analysis of Vector Measurement Accuracy Enhancement Techniques", 1982, Hewlett-Packard RF and Microwave Symposium and Exhibition.
6. P. J. Tasker, M. Schlechtweg, J. Braunstein: " On-wafer single contact S-parameter measurements to 75 GHz: Calibration procedure and measurement setup", 1993, European Microwave Conference, i305-307.