Statistical analysis of dark count rate in Geiger-mode APD FPAs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 9250, Issue , 2014, Pages

  Itzler, Mark A ^a   Krishnamachari, Uppili ^a   Chau, Quan ^a   Jiang, Xudong ^a   Entwistle, Mark ^a   Owens, Mark ^a   Slomkowski, Krystyna ^a  

^a PRINCETON LIGHTWAVE INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; GEIGER COUNTERS; IMAGE RESOLUTION; PIXELS; REMOTE SENSING; SPECTROSCOPY; STATISTICAL METHODS;

DARK COUNT RATE; GEIGER MODE AVALANCHE PHOTODIODE; INTER-ARRIVAL TIME; POISSONIAN STATISTICS; SIMILAR ANALYSIS; SPATIAL ANALYSIS; SPECTRAL RESPONSE; TEMPORAL ANALYSIS;

MILITARY APPLICATIONS;

EID: 84937238612     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2068744     Document Type: Conference Paper

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