Observations of Single-Event Upsets in Non-Hardened High-Density SRAMs in Sun-Synchronous Orbit

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 1817-1827

  Underwood, C I ^a   Ward, J W ^a   Dyer, C S ^b   Sims, A J ^b  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84937076364     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211372     Document Type: Article

References (7)

1. R. Koga et al., “On the Suitability of Non-Hardened High Density SRAMs for Space Applications”, IEEE Trans. Nucl. Sci., NS-38, 1507–1510, 1991.
2. R. Koga et al., “SEU Test Techniques for 256K Static RAMs and Comparisons of Upsets Induced by Heavy Ions and Protons”, IEEE Trans. Nucl. Sci., NS-35, 1638–1643, 1988.
3. L. Adams et al., “Proton-Induced Upsets in Low-Altitude Polar Orbit”, IEEE Trans. Nucl. Sci., NS36, 1989.
4. R. Harboe-Sorensen et al., “The Behaviour of Measured SEU at Low Altitude During Periods of High Solar Activity”, IEEE Trans. Nuc. Sci., NS-37, 1990.
5. C.S. Dyer et al., “Radiation Environment Measurements & Single Event Upset Observations in Sun-Synchronous Orbit”, IEEE Trans. Nucl. Sci., NS-38, 1700–1707, 1991.
6. M.S. Hodgart, “Efficient Coding and Error Monitoring for Spacecraft Digital Memory”, Int. J. Electronics, vol.73, No.1, 1–36, pp. 1992.
7. Texas Instruments MOS Memory Data Book 1982.