LRM Probe-Tip Calibrations using Nonideal Standards

IEEE Transactions on Microwave Theory and Techniques

Volumn 43, Issue 2, 1995, Pages 466-469

  Williams, Dylan F ^a   Marks, Roger B ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84936895900     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.348112     Document Type: Article

References (12)

1. D. F. Williams and R. B. Marks, “LRM probe-tip calibrations with imperfect resistors and lossy lines,” 42nd ARFTG Conf. Dig., pp 32–36, Dec. 1993
2. H. J. Eul and B. Schiek, “Thru-Match-Reflect: One result of a rigorous theory for deembedding and network analyzer calibration,” in Proc. 18th Euro. Microwave Conf., Sept. 1988, pp. 909–914.
3. G. F. Engen and C. A. Hoer, “Thru-Reflect-Line: An improved technique for calibrating the dual six-port automatic network analyzer,” IEEE Trans. Microwave Theory and Tech., vol. MTT-27, pp. 897–993, Dec. 1979.
4. R. B. Marks and D. F. Williams, “A general waveguide circuit theory,” J. Res. Natl. Inst. Stand. Technol., vol. 97, pp. 533–561, Sept.–Oct. 1992.
5. J. T. Barr and M. J. Pervere, “ A generalized vector network analyzer calibration technique,” 34th ARFTG Conf. Dig., pp. 51–60, Dec. 1989.
6. A. Davidson, E. Strid, and K. Jones, “Achieving greater on-wafer S-parameter accuracy with the LRM calibration technique,” 34th ARFTG Conf. Dig., pp. 61–66, Nov. 1989.
7. A. Davidson, E. Strid, and K. Jones, “LRM and LRRM calibrations with automatic determination of load inductance,” 36th ARFTG Conf. Dig., pp. 57–62, Nov. 1990.
8. R. B. Marks, “A multiline method of network analyzer calibration,” IEEE Trans. Microwave Theory Tech., vol. 39, pp. 1205–1215, July 1991.
9. R. B. Marks and D.F. Williams, “Characteristic impedance determination using propagation constant measurement,” IEEE Microwave and Guided Wave Lett., vol. 1, pp. 141–143, June 1991.
10. D. F. Williams and R. B. Marks, “Transmission line capacitance measurement,” IEEE Microwave and Guided Wave Lett., vol. 1, pp. 243–245. Sept. 1991.
11. D. K. Walker, D. F. Williams, and J. M. Morgan, “Planar resistors for probe station calibration,” 40th ARFTG Conf. Dig., pp. 1–9, Dec. 1992.
12. D. F. Williams, R. B. Marks, and A. Davidson, “Comparison of on-wafer calibrations,” 38th ARFTG Conf. Dig., pp. 68–81, Dec. 1991.