Reversible mechanical and electrical properties of ripped graphene

Physical Review Applied

Volumn 3, Issue 1, 2015, Pages

  Hinnefeld, J Henry ^a   Gill, Stephen T ^a   Zhu, Shuze ^b   Swanson, William J ^a   Li, Teng ^b   Mason, Nadya ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; FAILURE (MECHANICAL); GRAPHENE; GRAPHENE DEVICES;

ELECTRICAL TRANSPORT MEASUREMENTS; MECHANICAL AND ELECTRICAL PROPERTIES; MECHANICAL FAILURES; MECHANICAL ROBUSTNESS; MECHANICS SIMULATIONS;

TENSILE STRAIN;

EID: 84934912577     PISSN: None     EISSN: 23317019     Source Type: Journal    
DOI: 10.1103/PhysRevApplied.3.014010     Document Type: Article

References (19)

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