Enhanced charge-carrier transfer by CdS and Ag2S quantum dots co-sensitization for TiO2 nanotube arrays

Journal of Colloid and Interface Science

Volumn 457, Issue , 2015, Pages 1-8

  Liu, Zhongqing ^a   Ji, Gangqiang ^a,b   Guan, Debin ^b   Wang, Bin ^a   Wu, Xueliang ^a  

^a SICHUAN UNIVERSITY   (China)

^b RESEARCH CENTER OF LASER FUSION   (China)

Author keywords

Mott Schottky; QDs co sensitization; SILAR; Transient photovoltage

Indexed keywords

CADMIUM SULFIDE; CHARGE CARRIERS; CHARGE TRANSFER; CHEMICAL ANALYSIS; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ENAMELS; ENERGY DISPERSIVE SPECTROSCOPY; FIELD EMISSION MICROSCOPES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; IMAGE ENHANCEMENT; NANOCRYSTALS; NANOTUBES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; SPECTROSCOPY; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; YARN;

CO-SENSITIZATION; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MOTT-SCHOTTKY; SILAR; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS; TRANSIENT PHOTOVOLTAGE; UV-VIS DIFFUSE REFLECTANCE SPECTROSCOPY;

SILVER COMPOUNDS;

CADMIUM SULFIDE; NANOTUBE; QUANTUM DOT; SILVER; SULFATE; TITANIUM DIOXIDE;

ARTICLE; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; ELECTRIC POTENTIAL; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ENERGY RESOURCE; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; PRIORITY JOURNAL; ROENTGEN SPECTROSCOPY; SEMICONDUCTOR; SENSITIZATION; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION;

EID: 84934286460     PISSN: 00219797     EISSN: 10957103     Source Type: Journal    
DOI: 10.1016/j.jcis.2015.06.038     Document Type: Article

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