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Volumn , Issue , 1992, Pages 280-287

Synthesis of multi-level combinational circuits for complete robust path delay fault testability

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATION THEORY; DELAY CIRCUITS; ELECTRIC FAULT CURRENTS; FAULT TOLERANCE; TIMING CIRCUITS;

EID: 84933451691     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FTCS.1992.243573     Document Type: Conference Paper
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.