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Volumn , Issue , 2013, Pages 1-347
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Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization
a
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Author keywords
[No Author keywords available]
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Indexed keywords
BIOMATERIALS;
DIELECTRIC FILMS;
HYDROPHOBICITY;
POLYMER BLENDS;
QUALITY CONTROL;
SEMICONDUCTOR DEVICE MANUFACTURE;
BUSINESS OPPORTUNITIES;
FORMULATION DEVELOPMENT;
HUMIDITY AND TEMPERATURES;
INTERNATIONAL EXPERTS;
NANOMECHANICAL CHARACTERIZATION;
PERSONAL CARE PRODUCTS;
SEMICONDUCTOR INDUSTRY;
STEP-BY-STEP INSTRUCTIONS;
SCANNING PROBE MICROSCOPY;
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EID: 84932193025
PISSN: None
EISSN: None
Source Type: Book
DOI: 10.1002/9781118723111 Document Type: Book |
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Times cited : (23)
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References (0)
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