Systematic and random errors in rotating-analyzer ellipsometry

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 5, Issue 6, 1988, Pages 773-781

  de Nijs, J M M ^a   van Silfhout, A ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84931505041     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.5.000773     Document Type: Article

References (15)

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