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Volumn 7, Issue 17, 2015, Pages 7849-7857

Influence of electron storing, transferring and shuttling assets of reduced graphene oxide at the interfacial copper doped TiO2 p-n heterojunction for increased hydrogen production

(7) Babu, Sundaram Ganesh a Vinoth, Ramalingam a Praveen Kumar, Dharani b Shankar, Muthukonda V b Chou, Hung Lung c Vinodgopal, Kizhanipuram d Neppolian, Bernaurdshaw a

a SRM INSTITUTE OF SCIENCE AND TECHNOLOGY (India)

b YOGI VEMANA UNIVERSITY (India)

c NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY (Taiwan)

d NORTH CAROLINA CENTRAL UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; COPPER OXIDES; ENERGY GAP; HETEROJUNCTIONS; HYDROGEN PRODUCTION; IRRADIATION; LIGHT; LUMINESCENCE; PHOTOCATALYSTS; PHOTOCATALYTIC ACTIVITY; TIO2 NANOPARTICLES; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

DIFFUSED REFLECTANCE; LUMINESCENCE INTENSITY; PREPARATION TECHNIQUE; REDUCED GRAPHENE OXIDES; REDUCED GRAPHENE OXIDES (RGO); SIMULTANEOUS REDUCTION; VISIBLE-LIGHT IRRADIATION; WET IMPREGNATION METHOD;

GRAPHENE;

EID: 84929498009 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c5nr00504c Document Type: Article

Times cited : (186)

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