Multi-mode technique for the determination of the biaxial Y2SiO5 permittivity tensor from 300 to 6 K

Applied Physics Letters

Volumn 106, Issue 19, 2015, Pages

  Carvalho, N C ^a,b   Le Floch, J M ^a,b   Krupka, J ^c   Tobar, M E ^a,b  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^b School of Mathematics and Physics   (Australia)

^c WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DIELECTRIC MATERIALS; PERMITTIVITY; Q FACTOR MEASUREMENT; RARE EARTHS; REFRACTIVE INDEX; SILICON COMPOUNDS; TEMPERATURE DISTRIBUTION; TENSORS; UNCERTAINTY ANALYSIS;

ELECTROMAGNETIC MODES; ENGINEERED DEVICES; HYPERFINE TRANSITION; MICROWAVE CHARACTERIZATION; MICROWAVE COUPLING; PERMITTIVITY TENSORS; SIMULTANEOUS MEASUREMENT; TEMPERATURE DEPENDENCE;

WHISPERING GALLERY MODES;

EID: 84929353197     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4920987     Document Type: Article

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